• Acta Optica Sinica
  • Vol. 21, Issue 8, 952 (2001)
[in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese]. Effect of Film Thickness on Optical Properties of AgInSbTe Phase-Change Films[J]. Acta Optica Sinica, 2001, 21(8): 952 Copy Citation Text show less
    References

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    [2] Maeda Y, Andoh H, Ikuta I et al.. Reversible phase-change optical data storage in InSbTe alloy films. J. Appl. Phys., 1988, 64(4):1715~1719

    [3] Shinotsuka M, Shibaguchi T, Abe M et al.. Potentiality of the Ag-In-Sb-Te phase change recording material for high density erasable optical discs. Jpn. J. Appl. Phys., 1997, 36(1B):536~538

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    [9] Peng C, Cheng Lu, Mansuripur M. Experimental and theoretical investigations of laser-induced crystallization and amorphization in phase-change optical recording media. J. Appl. Phys., 1997, 82(9):4183~4191

    [10] Miao X S, Chong T C, Huang Y M et al.. Dependence of optical constants on film thickness of phase-change media. Jpn. J. Appl. Phys., 1999, 38(3B):1638~1641

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    [1] Zhang Kui, Geng Yongyou, Wu Yiqun, Dun Aihuan, Li Hao. Dependence of Optical Properties on Thickness of Sb2Te3 Film[J]. Acta Optica Sinica, 2011, 31(12): 1231002

    [2] Hu Wenhua, Chang Shengli, Yang Jiankun, Li Xiujian, Tan Jichun. Traditional and Differential Readout Technology for Super-Resolution Near-Field Structure Disc[J]. Acta Optica Sinica, 2011, 31(6): 621001

    [in Chinese], [in Chinese], [in Chinese]. Effect of Film Thickness on Optical Properties of AgInSbTe Phase-Change Films[J]. Acta Optica Sinica, 2001, 21(8): 952
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