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    Journals >Electro-Optic Technology Application >Volume 27 >Issue 6 >Page 38 > Article
    • Electro-Optic Technology Application
    • Vol. 27, Issue 6, 38 (2012)
    Comparison and Analysis on NETD Testing of Infrared System
    WEI Dong, XU Shi-wei, and WANG Da-peng
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    DOI: Cite this Article
    WEI Dong, XU Shi-wei, WANG Da-peng. Comparison and Analysis on NETD Testing of Infrared System[J]. Electro-Optic Technology Application, 2012, 27(6): 38 Copy Citation Text show less
    References

    [5] HOLST GC.Electro-Opitical Imaging System performance [M]. Winter Park:JCD Publishing,1995:362-367.

    [7] Ronaid G Driggers,Paul Cox,Timothy Edwards. Introduction to Infrared and Electro Optical[M]. ARTECT HOUSE，1999: 249-255.

    [8] HOLST GC.Testing and Evaluali of Infrared Imaging systems [M]. Winter Park:JCD Publishing,1993:131-134.

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    WEI Dong, XU Shi-wei, WANG Da-peng. Comparison and Analysis on NETD Testing of Infrared System[J]. Electro-Optic Technology Application, 2012, 27(6): 38
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