• Laser & Optoelectronics Progress
  • Vol. 59, Issue 13, 1312002 (2022)
Xinyi Zeng, Shiqian Wu, and Bin Chen*
Author Affiliations
  • Institute of Robotics and Intelligent Systems, School of Information Science and Engineering, Wuhan University of Science and Technology, Wuhan 430081, Hubei , China
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    DOI: 10.3788/LOP202259.1312002 Cite this Article Set citation alerts
    Xinyi Zeng, Shiqian Wu, Bin Chen. Hybrid-Coded Phase-Shifting Profilometry for Structured Light Measurement[J]. Laser & Optoelectronics Progress, 2022, 59(13): 1312002 Copy Citation Text show less
    Correspondence among wrapped phase, unwrapped phase, and phase order
    Fig. 1. Correspondence among wrapped phase, unwrapped phase, and phase order
    Correspondence between Gray code and phase
    Fig. 2. Correspondence between Gray code and phase
    Wrapped phase and intensity of sinusoidal stripe after amplitude modulation. (a) Wrapped phase; (b) corresponding intensity of sinusoidal stripe
    Fig. 3. Wrapped phase and intensity of sinusoidal stripe after amplitude modulation. (a) Wrapped phase; (b) corresponding intensity of sinusoidal stripe
    Mean error of the unwrapped phase in different periods T
    Fig. 4. Mean error of the unwrapped phase in different periods T
    Correspondence between the number of phase periods and De Bruijn sequence
    Fig. 5. Correspondence between the number of phase periods and De Bruijn sequence
    Four computer generated projection patterns
    Fig. 6. Four computer generated projection patterns
    Flowchart of unwrapping phase
    Fig. 7. Flowchart of unwrapping phase
    Incomplete period case. (a) Occluding falling edge, only left rising edge; (b) occluding rising edge, only left falling edge
    Fig. 8. Incomplete period case. (a) Occluding falling edge, only left rising edge; (b) occluding rising edge, only left falling edge
    Symbol judgment error caused by the maximum value being blocked
    Fig. 9. Symbol judgment error caused by the maximum value being blocked
    A mask. (a) Object to be tested; (b) fringe image captured by camera; (c) wrapped phase; (d) unwrapped phase
    Fig. 10. A mask. (a) Object to be tested; (b) fringe image captured by camera; (c) wrapped phase; (d) unwrapped phase
    3D point cloud results. (a) Frontal result; (b) profile result
    Fig. 11. 3D point cloud results. (a) Frontal result; (b) profile result
    Two water pipes placed front and back. (a) Object to be tested; (b) wrapped phase
    Fig. 12. Two water pipes placed front and back. (a) Object to be tested; (b) wrapped phase
    Phase unwrapping. (a) Wrapped phase; (b) phase order; (c) unwrapped phase
    Fig. 13. Phase unwrapping. (a) Wrapped phase; (b) phase order; (c) unwrapped phase
    Comparison of the reconstruction results between Gray code combined with phase-shifting method and the proposed method
    Fig. 14. Comparison of the reconstruction results between Gray code combined with phase-shifting method and the proposed method
    Reconstruction results of flat plate. (a) Reconstruction result of Gray code combined with phase-shifting method; (b) reconstruction results of multi-frequency heterodyne; (c) reconstruction results of proposed method
    Fig. 15. Reconstruction results of flat plate. (a) Reconstruction result of Gray code combined with phase-shifting method; (b) reconstruction results of multi-frequency heterodyne; (c) reconstruction results of proposed method
    MethodNumber of patternsAccuracy of wrapping phase
    Four-step phase-shifting+spatial phase wrapping4×
    Four-step phase-shifting+6-digit Gray code10
    Multi-frequency heterodyne12
    Table 1. Comparison of phase coding methods
    ParameterGray code+ phase-shiftingMulti-frequency heterodyneProposed method
    Standard deviation /mm0.2320.1980.319
    Number of patterns10124
    Table 2. Accuracy comparisons between Grey code + phase-shifting method, multi-frequency heterodyne, and proposed method
    Xinyi Zeng, Shiqian Wu, Bin Chen. Hybrid-Coded Phase-Shifting Profilometry for Structured Light Measurement[J]. Laser & Optoelectronics Progress, 2022, 59(13): 1312002
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