• Opto-Electronic Engineering
  • Vol. 35, Issue 3, 58 (2008)
WEI Yong-jie1、2、*, GE Bao-zhen1、2, and LIU Ying1、2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    WEI Yong-jie, GE Bao-zhen, LIU Ying. Amending Vignette Effect in Laser Particle Size Measurement with Gray System Theory[J]. Opto-Electronic Engineering, 2008, 35(3): 58 Copy Citation Text show less
    References

    [1] Berrocal Edouard,Churmakov Dmitry Y,Romanov Vadim P,et al.Crossed source-detector geometry for a novel spray diagnostic:Monte Carlo simulation and analytical results[J].Appl.Opt,2005,44(13):2519-2529

    [2] Zhenhua Ma,Henk G Merkus,Jan G A E de Smet,et al.New developments in particle characterization by laser diffraction:size and shape[J].Powder Technology,2000,111:66-78

    [5] XU Ren-liang.Particle Characterization:Light Scattering Methods[M].New York:Kluwer Academic Publishers,2002

    [8] GE Bao-zhen,WEI Yong-jie,LV Qie-ni.Inversion of particle size distribution with improved conjugate gradient algorithm[J].Opt.Eng,2007,46(5):054302-1-5

    [9] Allen T.Particle Size Measurement(5th ed)[M].London:Chapman &Hall,1997

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    WEI Yong-jie, GE Bao-zhen, LIU Ying. Amending Vignette Effect in Laser Particle Size Measurement with Gray System Theory[J]. Opto-Electronic Engineering, 2008, 35(3): 58
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