Author Affiliations
College of Metrology and Measurement Engineering, China Jiliang University, Hangzhou 310018, Zhejiang, Chinashow less
Fig. 1. Schematic of experimental apparatus
Fig. 2. Magnification calibration experimental results. (a) Test target 1951 USAF pattern; (b) element intensity image of group 6; (c) locally magnified intensity image of the 5th pair of lines
Fig. 3. Schematic of micro-nano one-dimensional grid structure
Fig. 4. Experimental results of transverse resolution calibration. (a) Reproduction phase of group 7 element in the resolution target; (b) phase reproduction of grid with 5 μm line width; (c) phase image reproduction of grid with 1 μm line width
Fig. 5. Measurement results of segment difference standard film. (a) Depth image; (b) height graph
Fig. 6. Chip physical diagram and structure diagram. (a) PDMS chip physical diagram; (b) PDMS chip channel at 50× magnification; (c) enlargement structure diagram of silicon substrate chip channel
Fig. 7. Straight channel holograms under different wavelengths. (a) 632.8 nm channel hologram; (b) 632.8 nm reference hologram; (c) 635.32 nm channel hologram; (d) 635.32 nm reference hologram
Fig. 8. Wrapped phase images of straight channel. (a) Wrapped phase for 632.8 nm; (b) wrapped phase for 635.32 nm; (c) equivalent wavelength phase distribution
Fig. 9. Straight channel measurement results. (a) Depth image; (b) three-dimensional topography image; (c) compare experimental result
Fig. 10. Circular chamber measurement results. (a) Depth image; (b) three-dimensional topography image; (c) sectional graph
Fig. 11. Silicon substrate chip measurement results. (a) Depth image; (b) three-dimensional topography image; (c) sectional graph
Measurement method | Width /μm | Depth /μm |
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Dual-wavelength digital holography | 75.8 | 48.6 | White light interferometry | 78.7 | 50.0 |
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Table 1. Comparison of three-dimensional topography measurement results of microfluidic chip straight channel
Measurement method | Width /μm | Depth /μm |
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Dual-wavelength digital holography | 76.6 | 48.5 | White light interferometry | 78.9 | 50 |
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Table 2. Comparison of three-dimensional topography measurement results of circular chamber channels in microfluidic chips