Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Opto-Electronic Engineering >Volume 44 >Issue 8 >Page 845 > Article
    • Opto-Electronic Engineering
    • Vol. 44, Issue 8, 845 (2017)
    High-precision measurement of low reflectivity specular object based on phase measuring deflectometry
    Yuxiang Wu, Huimin Yue, and Yong Liu
    Author Affiliations
  • State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu 610054, China
    • show less
    DOI: Cite this Article
    Yuxiang Wu, Huimin Yue, Yong Liu. High-precision measurement of low reflectivity specular object based on phase measuring deflectometry[J]. Opto-Electronic Engineering, 2017, 44(8): 845 Copy Citation Text show less
    References
    Abstract
    Get PDF
    Figures&Tables (0)
    Equations (0)
    References (0)
    Get Citation
    Copy Citation Text
    Yuxiang Wu, Huimin Yue, Yong Liu. High-precision measurement of low reflectivity specular object based on phase measuring deflectometry[J]. Opto-Electronic Engineering, 2017, 44(8): 845
    Download Citation
    Tools
    Share
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology