New path-following phase unwrapping algorithm based on quality-guided

[in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 34 >Issue 12 >Page 104 > Article

Opto-Electronic Engineering
Vol. 34, Issue 12, 104 (2007)

New path-following phase unwrapping algorithm based on quality-guided

[in Chinese]^1、2, [in Chinese]¹, and [in Chinese]^1、2

Author Affiliations

¹[in Chinese]

²[in Chinese]

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DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese]. New path-following phase unwrapping algorithm based on quality-guided[J]. Opto-Electronic Engineering, 2007, 34(12): 104 Copy Citation Text

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References

[1] Tiziani H H.High precision optical measurement methods[J].SPIE,1994,2248:2-16.

[2] Reid G T.Automatic fiinge pattern analysis:a review[J].Optics and Lasers in Engineering,1987,7(1):37-68.

[3] Crane R.Interference phase measurement[J].Appfied Optics,1969,8(3):538-542.

[4] Robinson D W,Reid G T.Interferogram Analysis[M].Bristol:Institute of Physics Publishing,1993.

[5] 5 Judge T R,Bryanston-Cross P J.A review of phase unwrapping techniques in fiinge analysis[J].Optics and laser in Engineering,1994,21(4):199-293.

[6] Ghiglia Dennis C,Pritt Mark D.Two-dimensional phase unwrapping theory,algorithms,and software[M].New York:John wiley & Sons.Inc,1998.

[7] Bone D J.Fourier fringe analysis:the two-dimensional phase unwrapping problem[J].Appfied Optics,1991,30(25):3627-3632.

[8] Itoh K.Analysis of the phase unwrapping algorithm[J].AppHed Optics,1982,21(14):2470.

CLP Journals

[1] Zhang Hen, Li Yanqiu, Liu Ke, Wu Shaoxiong. A New Phase Unwrapping Method Based on the Linear-Carrier Extension[J]. Acta Optica Sinica, 2010, 30(4): 1031

[2] ZHU Yong-jian, ZHU Li-xin, ZHONG Jian-ping, QI Guang-wen, LIU Wei-tao, SONG Shu-xiang. Integration Algorithm in Three-dimensional Plane Shape Measuring by Fringe Reflection[J]. Acta Photonica Sinica, 2018, 47(11): 1112001

[in Chinese], [in Chinese], [in Chinese]. New path-following phase unwrapping algorithm based on quality-guided[J]. Opto-Electronic Engineering, 2007, 34(12): 104

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