Key techniques for dynamic measurement of part size with double-path laser CCD

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 31 >Issue 3 >Page 33 > Article

Opto-Electronic Engineering
Vol. 31, Issue 3, 33 (2004)

Key techniques for dynamic measurement of part size with double-path laser CCD

[in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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[in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Key techniques for dynamic measurement of part size with double-path laser CCD[J]. Opto-Electronic Engineering, 2004, 31(3): 33 Copy Citation Text

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References

[2] CHEN Ming-jun,LI Dan,JIANG Cheng-bin.On-line measurement of Tool Wear Using Laser-CCD in Ultra-precision Cutting Process [J].SPIE,2001,4602(11):320-324.

[3] HAO Qun,ZHAO Yang,LI Da-cheng,et al.Application of metrix CCD for measuring geometrical deviation in large scale[J].Chinese Journal of scientific instrument,2000,20(4):111-113.

[4] LI Binhua,YANG Lei,MAO Wei,et al.Single-chip micro-controller system for CCD driving scan in LLMC [J].SPIE,2000,4903(10):158-166.

[8] PURLL D C,CLARIDGE J F.3nd Int.Conf On automated Inspection and Production Control [C].[s:l]:International Flaides Services Ltd,1978.10-32.

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Key techniques for dynamic measurement of part size with double-path laser CCD[J]. Opto-Electronic Engineering, 2004, 31(3): 33

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