• Journal of Infrared and Millimeter Waves
  • Vol. 38, Issue 1, 61 (2019)
JI Cheng1、2、* and Chen Yong-Ping1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.11972/j.issn.1001-9014.2019.01.011 Cite this Article
    JI Cheng, Chen Yong-Ping. Noise analysis of a CMOS TDI sensor with on chip signal accumulation in analog domain[J]. Journal of Infrared and Millimeter Waves, 2019, 38(1): 61 Copy Citation Text show less
    References

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    [2] M G Farrier and R. H. Dyck, "A Large Area TDI Image Sensor for Low Light Level Imaging," in IEEE J. Solid-State Circuits vol. 15, ed: IEEE, 1980, pp. 753-758.

    [3] F K Tsai, H Y Huang, L K Dai, et al, "A time-delay-integration CMOS readout circuit for IR scanning," in ICECS-02 vol. 1, ed: IEEE, 2002, pp. 347-350.

    [4] H Yu, X Qian, S Chen, and K S Low, "A Time-Delay-Integration CMOS image sensor with pipelined charge transfer architecture," in 2012 IEEE International Symposium on Circuits and Systems -ISCAS 2012, ed: IEEE, 2012, pp. 1624-1627.

    [5] K Nie, S Yao, J Xu, and J Gao, "Thirty Two-Stage CMOS TDI Image Sensor With On-Chip Analog Accumulator," in IEEE Trans. VLSI Syst. vol. 22, ed: IEEE, 2014, pp. 951-956.

    [6] Ceylan, Omer, et al. "Implementation of TDI based digital pixel ROIC with 15 μm pixel pitch." Infrared Technology and Applications XLII. Vol. 9819. International Society for Optics and Photonics, 2016.

    [7] Xu, Jiangtao, et al. "A Global Shutter High Speed TDI CMOS Image Sensor With Pipelined Charge Transfer Pixel." IEEE Sensors Journal 18.7 (2018): 2729-2736.

    [8] G Lepage, J Bogaerts, and G Meynants, "Time-Delay-Integration Architectures in CMOS Image Sensors," IEEE Transactions on Electron Devices, vol. 56, pp. 2524-2533, 2009.

    [9] Kawai N, Kawahito S. Noise analysis of high-gain, low-noise column readout circuits for CMOS image sensors[J]. IEEE Transactions on Electron Devices, 2004, 51(2): 185-194.

    [10] Yu, Hang, et al. "An 8-stage time delay integration CMOS image sensor with on-chip polarization pixels." Circuits and Systems (ISCAS), 2015 IEEE International Symposium on. IEEE, 2015.

    [11] Yu, Hang, et al. "An Antivibration Time-Delay Integration CMOS Image Sensor With Online Deblurring Algorithm." IEEE Trans. Circuits Syst. Video Techn. 26.8 (2016): 1544-1554.

    [12] Yin, Chin, et al. "A 32-stage 15-b digital time-delay integration linear CMOS image sensor with data prediction switching technique." IEEE Transactions on Electron Devices 64.3 (2017): 1167-1173.

    [13] Nie, Kaiming, Jiangtao Xu, and Zhiyuan Gao. "A 128-stage CMOS TDI image sensor with on-chip digital accumulator." IEEE Sensors Journal 16.5 (2016): 1319-1324.

    JI Cheng, Chen Yong-Ping. Noise analysis of a CMOS TDI sensor with on chip signal accumulation in analog domain[J]. Journal of Infrared and Millimeter Waves, 2019, 38(1): 61
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