Jiang Kun, Gao Aihua, Yan Lirong. Influence of Surface Defect Size of High-Reflection Mirror on Laser Scattering Field Distribution[J]. Laser & Optoelectronics Progress, 2021, 58(1): 112001
- Laser & Optoelectronics Progress
- Vol. 58, Issue 1, 112001 (2021)
Fig. 1. Reflectance distribution and defect model of high-reflection film. (a) Reflectance distribution; (b) defect model
Fig. 2. Distributions of different fields. (a) Incident field; (b) total field without defect; (c) total field with defect; (d) scattering field
Fig. 3. Spatial scattering field distributions of 9 groups of defects. （a）?(i) Group 1?group 9
Fig. 4. Variation of integral scattering light with the defect. (a) Variation of scattering light intensity with width; (b) variation of scattering light intensity with depth
Fig. 5. Principle of the integrated scattering measurement system
Fig. 6. Test system. (a) Integral scattering measurement system; (b) integrating sphere
Fig. 7. Test results of voltage. (a) Reference voltage after attenuation of incident light; (b) voltage of scattering light from standard sample
Fig. 8. Variation of the sample scattering rate. (a) Variation of scattering rate with width; (b) variation of scattering rate with depth
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Table 1. Dimensions of 9 groups of defect samples unti：
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Table 2. Measured voltages of 9 groups of different sizes of defects scattering unit: V
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