• Opto-Electronic Engineering
  • Vol. 37, Issue 11, 69 (2010)
HU Jian-ren*
Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    HU Jian-ren. Solar Eclipse Picture Analysis Method by the Contour Line on Maps[J]. Opto-Electronic Engineering, 2010, 37(11): 69 Copy Citation Text show less
    References

    [1] HU Jian-ren,XU Jiang-rong. Draw and Analysis of Contour line by Frame Radiation with Digital Diagram [J]. Journal of Hangzhou Institute of Electronic Engineering,2003,23(1):1-4.

    [2] Zhao H B,Lin Q S,Chen Y P,et al. Coronal structure and brightness profile of the total solar eclipse on August 1,2008 [J]. Chinese Sci Bull,2009,54:2905-2908.

    [3] HU Zhong-wei,ZHANG Hong,GUAN Zhen-biao,et al. Coronal structure at the total solar eclipse 2009-07-22 [J]. Chinese Sci Bull,2010,55(14):1416-1418.

    [4] ZHAO Shi-qing,LI Qiong-ying,TAO Jin-ping,et al. Observation of the Solar Chromosphere during the Partial Solar Eclipse in July 22,2009 in Kunming [J]. Astronomical Research & Technology,2010,7(2):85-88.

    [5] Jay M Pasachoff. Scientific Observations at Total Solar Eclipses [J]. Research in Astron. & Astrophys,2009,9(6):613-634.

    [6] HU Jian-ren. Measuring Method Research for Atmospheric Aerosol Concentration Based on Optical Imaging [J]. Chinese Journal of Scientific Instrument,2007,27(S1):44-46.

    [7] HU Jian-ren,QIN Hui-bin. Strategy on Research and Development of Special Type CCD Sensors and System [J].Micronanoelectronic Technology,2007,44(7/8):179-182.

    [8] TIAN Xie,SHA Fei,ZHANG Xin-sheng. Practical Imaging Analysis and Processing Technology [M]. Beijing:Electronic Industry Press,1995.

    HU Jian-ren. Solar Eclipse Picture Analysis Method by the Contour Line on Maps[J]. Opto-Electronic Engineering, 2010, 37(11): 69
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