• Opto-Electronic Engineering
  • Vol. 37, Issue 11, 69 (2010)
HU Jian-ren*
Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    HU Jian-ren. Solar Eclipse Picture Analysis Method by the Contour Line on Maps[J]. Opto-Electronic Engineering, 2010, 37(11): 69 Copy Citation Text show less

    Abstract

    Aimed at the abundant information about inner star dynamics on eclipse picture, a method for dealing with the picture was presented by contour line. According to blackbody or grey body radiation theory, the temperature is nearly equal if the brightness was the same. The color picture turned into binary processing with getting the threshold brightness value. Then it got a boundary line----the contour line on maps of appointed color rank by differential calculus twice. Solar eclipse picture is marked by selecting special contour line on maps. The sun surface spray, intensely hot atmosphere current vertical movement or advection are obtained from the solar corona, and the shape, structure and developing trends of the particle beams and solar prominence, and even the chromosphere structure are also acquired. Experimental results indicate that contour line on maps can identify the dark and sightless field structure. The more abundant atmosphere motion details are acquired on the sun or fixed stars under solar eclipse with low ISO and within limit exposure and un-PS picture. The shape of spray and spurting matter and the solar wind’s structures can be also found.
    HU Jian-ren. Solar Eclipse Picture Analysis Method by the Contour Line on Maps[J]. Opto-Electronic Engineering, 2010, 37(11): 69
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