Fig. 1. Schematic diagram of small-angle X-ray scattering measurement

Fig. 2. Schematic diagram of process for removing cosmic ray in SAXS measurement pattern

Fig. 3. Numerical simulation results of SAXS measuring periodic nanostructure. (a) Simulated long exposure SAXS measuring pattern; (b) simulated short exposure SAXS measuring pattern; (c) calibrate level of each spot in simulated long exposure SAXS measurement pattern; (d) mask for cosmic ray rejection by proposed method; (e) simulated long exposure SAXS measuring pattern after cosmic ray rejection by proposed method with ROI mask

Fig. 4. Confusion matrix of detection results of proposed method

Fig. 5. SAXS measuring patterns before and after denoising by three methods respectively under ROI mask. (a) Before denosing; (b) denoised by Laplacian edge detection; (c) denoised by multi-frame median pixel rejection; (d) denoised by proposed method

Fig. 6. Relationship between R_PSN and F_S of patterns before and after denoising by three methods respectively

Table 1. Evaluation indexes of denoised patterns before and after denoising by three methods respectively