[1] Hills. High heat load synchrotron optics. Proc. SPIE, 1992, 1739:456～463
[2] Anthony. High heat load optics: On historical overview. Opt. Engng., 1995, 34(2):313～320
[3] Sostero G, Cocco D, Qian S N. Metrological challenges of synchrotron radiation optics. Proc. SPIE, 1999, 3739:310～316
[4] Weingartner I, Schulz M, Elster C. Novel scanning technique for ultraprecise measurement of topography. Proc. SPIE, 1999, 3782:306～317
[5] Yu Jingchi, Xu Jinqiang, Zhang Xuejun et al.. Surface contour measurement using an optical scanner. Proc. SPIE, 1995, 2536:192～199
[6] Von Bieren. Pencil beam interferometer for aspherical optical surfaces. Proc. SPIE, 1982, 343:101～108
[7] Takacs P Z, Qian S N, Colbert J. Design of a long trace surface profiler. Proc. SPIE, 1987, 749:59～64
[8] Steve Irick. Long trace profiler survey results. Proc. SPIE, 1999, 3782:275～282
[9] Goodman J W. Introduction of Fourier Optics. San Francisco: McGraw-Hill, 1968. 61～62
