Qi-Wen ZHANG, Hong-Lei CHEN, Rui-Jun DING. High precision time-to-digital conversion circuit for mercury cadmium telluride APD detector at 77 K[J]. Journal of Infrared and Millimeter Waves, 2022, 41(1): 2021084
- Journal of Infrared and Millimeter Waves
- Vol. 41, Issue 1, 2021084 (2022)
Fig. 1. Excess noise factor of APD FPA and GNDCD with different bias
Fig. 2. Comparison of this article and DRS in NEPh
Fig. 3. I-V curves of NMOS at 77 K and 300 K. The size of the NMOS is W/L=20 μm/0.55 μm
Fig. 4. ROIC overall block diagram
Fig. 5. TDC sequence chart
Fig. 6. The comparator schematic diagram
Fig. 7. Simulation results of input offset voltage of comparator
Fig. 8. Vernier TDC structural diagram
Fig. 9. The delay cell circuit
Fig. 10. Delay time for different temperatures and different bias voltages
Fig. 11. The schematic block diagram of TDC circuit Testing system
Fig. 12. Test sequence diagram
Fig. 13. Coarse counting test results at room temperature and low temperature
Fig. 14. Fine counting value at room temperature and low temperature test
Fig. 15. （a）Differential non-linearity，（b）integral non-linearity
Fig. 16. The output results of fine counting under different delay time
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Table 1. Extraction results of the MOSFET parameters
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Table 2. Comparator simulation results
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Table 3. Vernier TDC simulated output
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Table 4. Compare the performance parameters of this work and Raytheon at 300 K and 77 K
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