Author Affiliations
College of Electronics and Information Engineering, Sichuan University, Chengdu, Sichuan 610065, Chinashow less
Fig. 1. Optical geometry of measurement system
Fig. 2. (a) Daughter wavelets with different scales; (b) Fourier spectra of daughter wavelets; (c) mother wavelets with different fb values; (d) Fourier spectra of mother wavelets
Fig. 3. (a) Deformed fringe pattern without noise; (b) wavelet ridges with different fb values; (c) unwrapped phase of Fig. 3(b); (d) wavelet ridges when fb is equal to 0.2; (e) unwrapped phase of Fig. 3(d)
Fig. 4. (a) Deformed fringe pattern considering random noise with mean square deviation of 0.20; (b) wavelet ridges with different fb values; (c) unwrapped phase of Fig. 4(b); (d) wavelet ridges introducing improved wavelet processing method; (e) unwrapped phase of improved wavelet processing method
Fig. 5. (a) Simulated object; (b) deformed fringe pattern
Fig. 6. Error distribution without noise. (a) fb=0.5; (b) fb=1.0; (c) fb=1.5; (d) fb=2.0
Fig. 7. Error considering random noise influence with mean square deviation of 0.20.(a) fb=0.5; (b) fb=1.0; (c) fb=1.5; (d) fb=2.0
Fig. 8. Results and error distribution considering random noise with mean square deviation of 0.20. (a) Reconstruction results by improved wavelet processing method; (b) reconstruction error distribution by improved wavelet processing method; (c) error distribution by method proposed by Liu et al.[8]
Fig. 9. (a) Deformed fringe with low noise; (b) fringe distribution of the 381th row in Fig. 9(a)
Fig. 10. (a) Unwrapped phase by employing improved wavelet processing method; (b) unwrapped phase of the 381th row of deformed fringe pattern
Fig. 11. (a) Deformed fringe pattern with high noise level; (b) fringe distribution of the 286th row in Fig. 11(a)
Fig. 12. (a) Wrapped phase when fb=1.0; (b) wrapped phase when fb=2.0; (c) unwrapped phase when fb=1.0; (d) unwrapped phase when fb=2.0; (e) wrapped phase extracted by method proposed by Liu et al.[8]; (f) wrapped phase extracted by improved wavelet processing method; (g) unwrapped phase extracted by method proposed by Liu et al[8]; (h) unwrapped phase extracted by improved wavelet processing method
Mean squaredeviation of noise | Standard deviation for improvedwavelet processing method /mm | Standard deviation for complex Morlet wavelet method /mm |
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fb=0.5 | fb=1.0 | fb=1.5 | fb=2.0 |
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0 | 0.0700 | 0.0699 | 0.1021 | 0.1297 | 0.1520 | 0.05 | 0.0776 | 0.0766 | 0.1056 | 0.1320 | 0.1537 | 0.10 | 0.0945 | 0.0935 | 0.1150 | 0.1384 | 0.1587 | 0.15 | 0.1143 | 0.1154 | 0.1276 | 0.1465 | 0.1645 | 0.20 | 0.1392 | 0.2645 | 0.2665 | 0.1597 | 0.1753 |
|
Table 1. Standard deviation of reconstruction errors for complex Morlet wavelet method with different fb values and improved wavelet processing method at different noise levels