• Chinese Journal of Quantum Electronics
  • Vol. 21, Issue 4, 468 (2004)
[in Chinese]* and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese]. Evolution of the fidelity in the degenerate Raman process[J]. Chinese Journal of Quantum Electronics, 2004, 21(4): 468 Copy Citation Text show less
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    [in Chinese], [in Chinese]. Evolution of the fidelity in the degenerate Raman process[J]. Chinese Journal of Quantum Electronics, 2004, 21(4): 468
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