• Acta Optica Sinica
  • Vol. 22, Issue 7, 852 (2002)
[in Chinese]*, [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Development of Elementary Arrangement for Exterme Ultraviolet Projection Lithography[J]. Acta Optica Sinica, 2002, 22(7): 852 Copy Citation Text show less

    Abstract

    The prototype for extreme ultraviolet projection lithography at 13 nm wavelength includes a laser plasma source, an ellipsoidal condenser, a transmission mask, the Schwarzschild objective, a resist coated wafer and the associated vacuum apparatus. The optical design is optimized to achieve a resolution better than 0.1 μm over a 0.1 mm diameter image field of view.
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Development of Elementary Arrangement for Exterme Ultraviolet Projection Lithography[J]. Acta Optica Sinica, 2002, 22(7): 852
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