[1] Lakshminarasimhan N, Varadaraju U V. J. Electrochemical Society, 2005, 152(9): H152.
[2] Su L T, Tok A I Y, Boey F Y C, et al. J. Appl. Phys., 2007, 102: 083541.
[3] Li P L, Yang Z P, Wang Z J, et al. Chin. Sci. Bull., 2008, 53(7): 974.
[4] Park J K, Kim C H, Park S H, et al. Appl. Phys. Lett., 2004, 84(10): 1647.
[5] Li P L, Yang Z P, Wang Z J, et al. Chin. Phys. B, 2008, 17(3): 1135.
[6] Kim J S, Jeon P E, Choi J C, et al. Appl. Phys. Lett., 2004, 84(15): 2931.
[7] Yang W J, Chen T M. Appl. Phys. Lett., 2006, 88(10): 101903-1.
[9] Li P L, Pang L B, Wang Z J, et al. J. Alloys Comp., 2009, 478(9-10): 813.
[10] Chang C K, Chen T M. Appl. Phys. Lett. 2007, 91: 081902-1.
[11] Song Y H, Jia G, Yang M, et al. Appl. Phys. Lett., 2009, 94: 091902-1.
[12] Yang W J, Chen T M. Appl. Phys. Lett., 2007, 90: 171908-1.
[14] Li P L, Yang Z P, Wang Z J, et al. Chin. Phys. B, 2008, 17(5): 1907.
[15] Zhang M, Wang J, Ding W, et al. Appl. Phys. B, 2007, 86: 647.
[16] Sakasai K, Katagiri M, Toh K, et al. Appl. Phys. A, 2002, 74(Suppl.): S1589.
[17] Yuan S H, Chen X L, Zhu C F, et al. Opt. Mater., 2007, 30: 192.
[19] Tian L H, Mho S I. Solid State Communication, 2003, 125: 647.