[1] E. F. Zalewski, J. Geist. Silicon photodiode spectral response self-calibration[J]. Appl. Opt., 1980, 19(8): 1214～1216
[2] N. P. Fox. Radiometry with cryogenic radiometers and semiconductor photodiodes[J]. Metrologia, 1996, 32(6): 535～543
[3] N. P. Fox, C. J. Chunnilall, M. G. White. Detector based transfer standards for improved accuracy in spectral irradiance and radiance measurements[J]. Metrologia, 1998, 35(4): 555～561
[4] L. Werner, J. Fischer, U. Johannsen U et al.. Accurate determination of the spectral responsivity of silicon trap detectors between 238 nm and 1015 nm using a laser-based cryogenic radiometer[J]. Metrologia, 2000, 37(4): 279～284
[5] L. Werner, R. Friedrich, U. Johannsen et al.. Precise scale of spectral responsivity for InGaAs detectors based on a cryogenic radiometer and several laser sources[J]. Metrologia, 2000, 37(5): 523～526
[6] B. N. Taylor, C. E. Kuyatt. Guidelines for evaluating and expressing the uncertainty of NIST measurement results. http:∥physics.nist.gov/pubs/guidelines
[8] Toomas Kübarsepp, Atte Haapalinna, Petri Krh et al.. Nonlinearity measurements of silicon photodetectors[J]. Appl. Opt., 1998, 37(13): 2716～2722
[9] Atte Haapalinna, Toomas Kübarsepp, Petri Krh et al.. Measurement of the adsolute linearity of photodetectors with a diode laser[J]. Meas. Sci. Technol., 1999, 10(11): 1075～1078
[13] C. L. Sanders. A photocell linearity tester[J]. Appl. Opt., 1962, 1(3): 207～211
[14] W. Budde. Multidecade,linearity measurements on Si photodiodes[J]. Appl. Opt., 1979, 18(10): 1555～1558
[16] D. A. Swyt, J. G. LaRock. Inverse-fourth apparatus for photometric calibrations[J]. Rev. Sci. Instrum., 1978, 49(8): 1083～1089
[17] R. C. Hawes. Technique for measuring photometric accuracy[J]. Appl. Opt., 1971, 10(6): 1246～1253
[18] C. L. Sanders. Accurate measurements of and corrections for nonlinearities in radiometers[J]. J. Res. Natl. Bur. Stand., 1972, 76(4): 437～455
[19] H. E. Bennett. Accurate method for detecting photometric linearity[J]. Appl. Opt., 1966, 5(8): 1265～1270
