Research on ground simulation testing technology of low orbit TDICCD camera image quality

Junzhou CHENG; Mingpeng HU; Yulong WANG; Wenbo YANG

doi:10.3969/j.issn.1005-5630.2022.03.003

Journals >Optical Instruments >Volume 44 >Issue 3 >Page 14 > Article

Optical Instruments
Vol. 44, Issue 3, 14 (2022)

Research on ground simulation testing technology of low orbit TDICCD camera image quality

Junzhou CHENG^1,2, Mingpeng HU^1,*, Yulong WANG^1,2, and Wenbo YANG^1,2

Author Affiliations

¹Institute of Optics and Electronics Chinese Academy of Sciences, Chengdu 610209, China

²University of Chinese Academy of Sciences, Beijing 100049, China

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DOI: 10.3969/j.issn.1005-5630.2022.03.003 Cite this Article

Junzhou CHENG, Mingpeng HU, Yulong WANG, Wenbo YANG. Research on ground simulation testing technology of low orbit TDICCD camera image quality[J]. Optical Instruments, 2022, 44(3): 14 Copy Citation Text

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References

[5] WONG H S, YAO Y L, SCHLIG E S. TDI charge-coupled devices: Design and applications[J]. IBM Journal of Research and Development, 36, 83-106(1992).

[13] DUBEY N, BANERJEE A. Dynamic MTF improvement scheme its validation f CCD operating in TDI mode f earth imaging applications[C]Proceedings Volume 9881, Earth Observing Missions Senss: Development, Implementation, acterization IV. New Delhi, India: SPIE, 2016.

Junzhou CHENG, Mingpeng HU, Yulong WANG, Wenbo YANG. Research on ground simulation testing technology of low orbit TDICCD camera image quality[J]. Optical Instruments, 2022, 44(3): 14

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