Research on ground simulation testing technology of low orbit TDICCD camera image quality

Junzhou CHENG; Mingpeng HU; Yulong WANG; Wenbo YANG

doi:10.3969/j.issn.1005-5630.2022.03.003

Journals >Optical Instruments >Volume 44 >Issue 3 >Page 14 > Article

Optical Instruments
Vol. 44, Issue 3, 14 (2022)

Research on ground simulation testing technology of low orbit TDICCD camera image quality

Junzhou CHENG^1,2, Mingpeng HU^1,*, Yulong WANG^1,2, and Wenbo YANG^1,2

Author Affiliations

¹Institute of Optics and Electronics Chinese Academy of Sciences, Chengdu 610209, China

²University of Chinese Academy of Sciences, Beijing 100049, China

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DOI: 10.3969/j.issn.1005-5630.2022.03.003 Cite this Article

Junzhou CHENG, Mingpeng HU, Yulong WANG, Wenbo YANG. Research on ground simulation testing technology of low orbit TDICCD camera image quality[J]. Optical Instruments, 2022, 44(3): 14 Copy Citation Text

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Abstract

In order to assemble and test a microstructure TDICCD camera, a dynamic MTF test device was proposed and built. The MTF of the camera is measured by the edge method. After theoretical analysis and experimental verification, the measurement accuracy of the device is better than 5%, which meets the design requirements. The device is used to analyze the influence of the two factors of speed-to-height ratio and drift angle on the image quality of TDICCD camera, and the results are consistent with the theory. The construction of this device satisfies the requirements of the ground dynamic MTF test of the TDICCD camera, and has certain engineering significance.

Keywords

dynamic modulation transfer function edge method imaging quality TDICCD test device

\begin{aligned} {M T F}_{测 量} = & {M T F}_{照 明} \times {M T F}_{靶 标} \times {M T F}_{调 整 台} \times \\ {M T F}_{平 行 光 管} \times {M T F}_{被 测 系 统} \end{aligned}

(1)

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\begin{matrix} I_{u n i f} = \frac{I_{m a x} - I_{m i n}}{I_{m a x} + I_{m i n}} \end{matrix}

(2)

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\begin{matrix} \frac{f_{1}}{f_{2}} = \frac{v_{1}}{v_{2}} \end{matrix}

(3)

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\begin{matrix} {M T F}_{x} (f) = \frac{\sin (π f m a \frac{Δ v}{v})}{π f m a \frac{Δ v}{v}} = \frac{\sin (\frac{π}{2} \frac{f}{f_{N}} m \frac{Δ v}{v})}{\frac{π}{2} \frac{f}{f_{N}} m \frac{Δ v}{v}} \end{matrix}

(4)

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\begin{array}{r} {M T F}_{y a w_{y}} (f) = \frac{\sin (π f m a \tan (θ))}{π f m a \tan (θ)} = \frac{\sin (\frac{π}{2} \frac{f}{f_{N}} m \tan (θ))}{\frac{π}{2} \frac{f}{f_{N}} m \tan (θ)} \end{array}

(5)

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\begin{aligned} {M T F}_{y a w_{x}} (f) & = \frac{\sin (π f m a (1 - \cos (θ)))}{π f m a (1 - \cos (θ))} \\ = \frac{s i n (\frac{π}{2} \frac{f}{f_{N}} m (1 - \cos (θ)))}{\frac{π}{2} \frac{f}{f_{N}} m (1 - \cos (θ))} \end{aligned}

(6)

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\begin{matrix} Δ Z = \pm \frac{λ}{2 (u^{2})} \end{matrix}

(7)

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\begin{matrix} \frac{f_{1}}{f_{2}} = \frac{d_{1}}{d_{2}} \end{matrix}

(8)

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Junzhou CHENG, Mingpeng HU, Yulong WANG, Wenbo YANG. Research on ground simulation testing technology of low orbit TDICCD camera image quality[J]. Optical Instruments, 2022, 44(3): 14

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