• Opto-Electronic Engineering
  • Vol. 31, Issue 7, 38 (2004)
[in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Analysis for property of CGH on spherical surface used for aspheric surface testing[J]. Opto-Electronic Engineering, 2004, 31(7): 38 Copy Citation Text show less
    References

    [1] BURGE J H. Applications of computer-generated holograms for interferometric measurement of large aspheric optics [J]. SPIE, 1995, 2576: 258-269.

    [2] BURGE J H, ANDERSON D S, MILSTER T D. Measurement of a convex secondary mirror using a holographic test plat [J]. SPIE, 1994, 2199: 193-198.

    [3] BURGE J H, ANDERSON D S. Full aperture interferometeric test of convex secondary mirrors using holographic test plates [J]. SPIE, 1994, 2199: 181-192.

    [4] BURGE J H. Fizeau interferometry for large convex surface [J]. SPIE, 1995, 2536: 127-137.

    [5] BURGE J H. Measurement of large convex aspheres [J]. SPIE, 1996, 2871: 362-373.

    [6] LINDLEIN N. Analysis of the disturbing diffraction orders of computer-generated holograms used for testing optical aspherics [J]. Applied Optics, 2001, 40(16): 2698-2709.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Analysis for property of CGH on spherical surface used for aspheric surface testing[J]. Opto-Electronic Engineering, 2004, 31(7): 38
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