[1] Hou Y, Huang Z M, Gao Y Q, et al. Characterization of Mn1.56Co0.96Ni0.48O4 films for infrared detection [J]. Applied Physics Letters. 2008, 92(20):202115.
[2] Ouyang C, Zhou W, Wu J, et al. Uncooled bolometer based on Mn1.56Co0.96Ni0.48O4 thin films for infrared detection and thermal imaging [J]. Applied Physics Letters. 2014, 105(2):022105.
[3] Jagtap S, Rane S, Gosavi S, et al. Characterization and electrical properties of spinel-type environment friendly thick film NTC thermistors [J]. Journal of the European Ceramic Society. 2008, 28(13):2501-7.
[5] Wu J, Huang Z M, Hou Y, et al. Structural, electrical, and magnetic properties of Mn2.52-xCoxNi0.48O4 films[J]. Journal of Applied Physics. 2010, 107(5):053716.
[6] Wu J, Huang Z M, Zhou W, et al. Investigation of cation distribution, electrical, magnetic properties and their correlation in Mn2-xCo2xNi1-xO4 films [J]. Journal of Applied Physics. 2014, 115(11):113703.
[7] Wei S H, Zhang S B. First-principles study of cation distribution in eighteen closed-shell AIIB2IIIO4 and AIVB2IIO4 spinel oxides [J]. Physical Review B. 2001, 63(4):045112.
[8] Castelan P, Ai B, Loubiere A, et al. Aging study of nickel -copper -manganite negative temperature coefficient thermistors by thermopower measurements [J]. Journal of Applied Physics. 1992, 72(10):4705-9.
[9] Ma C J, Liu Y F, Lu Y N, et al. Effect of Zn substitution on the phase, microstructure and electrical properties of Ni0.6Cu0.5ZnxMn1.9-xO4(0≤x≤1) NTC ceramics [J]. Materials Science and Engineering: B. 2014, 188:66-71.
[10] Kanade SA, Puri V. Composition dependent resistivity of thick film Ni1-xCoxMn2O4: (0≤x≤1) NTC thermistors [J]. Materials Letters. 2006, 60(11):1428-31.
[12] Xie Y H, Ji G, Bu H J, et al. Effect of oxygen partial pressure and temperature on NTC characteristics of Mn1.56Co0.96Ni0.48O4 thin films grown on SrTiO3 (100) by laser MBE [J]. Journal of Alloys and Compounds. 2014, 611:100-3.
[13] Ji G, Chang A M, Li H Y, et al. Epitaxial growth of Mn-Co-Ni-O thin films and thickness effects on the electrical properties [J]. Materials Letters. 2014, 130:127-30.
[14] Ji G, Chang A M, Xu J B, et al. Low-temperature (<300℃) growth and characterization of single-[100]-oriented Mn-Co-Ni-O thin films [J]. Materials Letters. 2013, 107:103-6.
[15] Zhou W, Zhang L B, Ouyang C, et al. Micro structural, electrical and optical properties of highly (220) oriented spinel Mn-Co-Ni-O film grown by radio frequency magnetron sputtering [J]. Applied Surface Science. 2014, 311:443-7.
[16] Kong W W, Wei W, Gao B, et al. Mn1.56Co0.96Ni0.48O4±δ flexible thin films fabricated by pulsed laser deposition for NTC applications [J]. Materials Science and Engineering: B. 2016, 206:39-44.
[17] Gao Y Q, Huang Z M, Hou Y, et al. Crystallization-dependent magnetic properties of Mn1.56Co0.96Ni0.48O4 thin films [J]. Applied Surface Science. 2010, 256(8):2552-6.
[18] Mu L L, Feng C J. Topological research on lattice energies for inorganic compounds [J]. MATCH Commun Math Comput Chem. 2006, 56:97-111.
[19] Schmidt R, Basu A, Brinkman A W, et al. Electron-hopping modes in NiMn2O4+δ materials [J]. Applied Physics Letters. 2005, 86(7):073501.
[20] Coey J M D, Viret M, Ranno, L. Electron localization in mixed-valence manganites [J]. Phys Rev Lett. 1995, 75(21):3910-3.
[21] Amer M A, Meaz T M, Attalah S S, et al. Structural phase transformation of as-prepared Mg-Mn nanoferrites by annealing temperature [J]. Materials Characterization. 2015, 110:197-207.
[23] Efros A L, Shklovskii B I. Coulomb gap and low temperature conductivity of disordered systems [J]. J Phys C: Solid State Phys. 1975, 8:L49-L51.
[24] Shklovskii B L, Efros A L. Electronic properties of doped semiconductors [M]. Springer-Verlag,Berlin. 1984.
[25] Wu J, Huang Z M, Hou Y, et al. Structural, electrical, and magnetic properties of Mn 2.52-xCoxNi0.48O4 films[J]. Journal of Applied Physics. 2010, 107:053716.
[26] Yokoyama T, Meguro T, Shimada Y, et al. Preparation and electrical properties of sintered oxides composed of Mn1.5Co0.25+XNi1.25-XO4 (0≤x≤0.75) with a cubic spinel structure [J]. Journal of Materials Science. 2007, 42(14):5860-6.