Overview of simulation test system used for photoelectronic countermeasure

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Infrared and Laser Engineering >Volume 32 >Issue 6 >Page 551 > Article

Infrared and Laser Engineering
Vol. 32, Issue 6, 551 (2003)

Overview of simulation test system used for photoelectronic countermeasure

[in Chinese]^*, [in Chinese], [in Chinese], and [in Chinese]

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[in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Overview of simulation test system used for photoelectronic countermeasure[J]. Infrared and Laser Engineering, 2003, 32(6): 551 Copy Citation Text

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References

CLP Journals

[1] Fang Yanchao, Wang Jianjun, Yu Guoquan, Cui Shuang, Li Yan. Laser signal generating method in internal field simulation experiment[J]. Infrared and Laser Engineering, 2015, 44(6): 1766

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Overview of simulation test system used for photoelectronic countermeasure[J]. Infrared and Laser Engineering, 2003, 32(6): 551

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