WU ZHOULING, FAN ZHONGXIU. Measurement of bulk and interface absorption in Multilayer coatings[J]. Acta Optica Sinica, 1989, 9(7): 630
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By an appropriate variation in the thickness of the high and low refracting components, a the bulk and interface absorption of dielectric TiO2/SiO2 multilayer stacks was investigated using transverse photothermal deflection technique. The results are in good agreement with those previously reported using photoacoustio method.