Author Affiliations
1National Engineering Research Center of Electromagnetic Radiation Control Material, University of Electronic Science and Technology of China, Chengdu, Sichuan 610054, China2School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan 610054, Chinashow less
Fig. 1. Schematic of device structure
Fig. 2. Reflectivity as a function of r, h, p, θ, and wavelength. (a) Reflectivity versus r when h=30 nm, p=600 nm, and θ=45°; (b) reflectivity versus h when r=70 nm, p=600 nm, and θ=45°;(c) reflectivity versus p when r=70 nm, h=30 nm, and θ=45°;(d) reflectivity versus θ when r=70 nm, h=30 nm, and p=650 nm
Fig. 3. Cross-section of device and magnetic field H distributions under different structural parameters. (a) Cross-section of xoz plane of device when r=100 nm; (b) SPP mode;(c) LSPR mode; (d) coupling mode when r=70 nm
Fig. 4. TMOKE as a function of r, h, p, θ, and wavelength. (a) TMOKE versus r when h=30 nm, p=600 nm, and θ=45°; (b) TMOKE versus h when r=70 nm, p=600 nm, and θ=45°;(c) TMOKE versus p when r=70 nm, h=30 nm, and θ=45°; (d) TMOKE versus θ when r=70 nm, h=30 nm, and p=650 nm
Fig. 5. Refractive index sensing performance of the device. (a) Change of TMOKE at different refractive indexes; (b) change of peak position at different refractive indexes
n /RIU | 1.000 | 1.002 | 1.004 | 1.006 | 1.008 | 1.010 |
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Γ /nm | 0.8267 | 0.5324 | 0.2267 | 0.5541 | 1.1200 | 1.8900 | FoM /RIU-1 | 601.3548 | 933.7716 | 2192.4586 | 897.1962 | 443.8750 | 263.0370 |
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Table 1. Line width and FoM of sensing signal of the device at different refractive indexes