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    Journals >Chinese Journal of Quantum Electronics >Volume 36 >Issue 3 >Page 284 > Article
    • Chinese Journal of Quantum Electronics
    • Vol. 36, Issue 3, 284 (2019)
    Test Method of conic aspheric surface with semi-transmitting lens
    ZHAOPengwei 1、2、*, Lu YE1, Wenqi HU1, and Liehua ZHENG1
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  • 1[in Chinese]
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    DOI: 10.3969/j.issn.1007-5461.2019.03.005 Cite this Article
    ZHAOPengwei, YE Lu, HU Wenqi, ZHENG Liehua. Test Method of conic aspheric surface with semi-transmitting lens[J]. Chinese Journal of Quantum Electronics, 2019, 36(3): 284 Copy Citation Text show less
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    ZHAOPengwei, YE Lu, HU Wenqi, ZHENG Liehua. Test Method of conic aspheric surface with semi-transmitting lens[J]. Chinese Journal of Quantum Electronics, 2019, 36(3): 284
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