Reliability Forecasting of Radar Circuit Board Based on Fuzzy Degeneration Data

LIU Xiao-pan; CAI Jin-yan; WU Shi-hao; SUN Zhi-wang

doi:10.3969/j.issn.1671-637x.2017.04.018

Journals >Electronics Optics & Control >Volume 24 >Issue 4 >Page 76 > Article

Electronics Optics & Control
Vol. 24, Issue 4, 76 (2017)

Reliability Forecasting of Radar Circuit Board Based on Fuzzy Degeneration Data

LIU Xiao-pan, CAI Jin-yan, WU Shi-hao, and SUN Zhi-wang

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[in Chinese]

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DOI: 10.3969/j.issn.1671-637x.2017.04.018 Cite this Article

LIU Xiao-pan, CAI Jin-yan, WU Shi-hao, SUN Zhi-wang. Reliability Forecasting of Radar Circuit Board Based on Fuzzy Degeneration Data[J]. Electronics Optics & Control, 2017, 24(4): 76 Copy Citation Text

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References

[1] KAUFMANN A. Introduction to the fuzzy subsets［M］. New York: Academic Press, 1975.

[2] HUANG H Z. Reliability analysis method in the presence of fuzziness attached to operating time［J］. Microelectronics and Reliability, 1995, 35(12): 1483-1487.

[11] WU H C. Statistical confidence intervals for fuzzy data［J］. Expert Systems with Applications, 2009, 36(2): 2670-2676.

LIU Xiao-pan, CAI Jin-yan, WU Shi-hao, SUN Zhi-wang. Reliability Forecasting of Radar Circuit Board Based on Fuzzy Degeneration Data[J]. Electronics Optics & Control, 2017, 24(4): 76

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