• Electronics Optics & Control
  • Vol. 24, Issue 4, 76 (2017)
LIU Xiao-pan, CAI Jin-yan, WU Shi-hao, and SUN Zhi-wang
Author Affiliations
  • [in Chinese]
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    DOI: 10.3969/j.issn.1671-637x.2017.04.018 Cite this Article
    LIU Xiao-pan, CAI Jin-yan, WU Shi-hao, SUN Zhi-wang. Reliability Forecasting of Radar Circuit Board Based on Fuzzy Degeneration Data[J]. Electronics Optics & Control, 2017, 24(4): 76 Copy Citation Text show less

    Abstract

    Aiming at the fuzzy uncertainty problem in accelerated degradation test of electronic products, we proposed a reliability forecasting method for radar circuit board based on fuzzy degeneration data. Fuzzy processing was carried out to the test data obtained in degradation test, and a model for parameter estimation was established based on alpha set variables by using fuzzy set decomposition theorem. A fuzzy data processing method based on degraded trajectory was given. Fuzzy reliability prediction analysis was made by taking the frequency degradation data of the radar circuit board as an example, and the fuzzy reliability of the circuit board was obtained. The method provides a more accurate guidance for electronic equipment maintenance, thus can reduce the functional risks and improve the battlefield support capability.
    LIU Xiao-pan, CAI Jin-yan, WU Shi-hao, SUN Zhi-wang. Reliability Forecasting of Radar Circuit Board Based on Fuzzy Degeneration Data[J]. Electronics Optics & Control, 2017, 24(4): 76
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