Power spectral density measurement for large aspheric surfaces

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 33 >Issue 3 >Page 20 > Article

Opto-Electronic Engineering
Vol. 33, Issue 3, 20 (2006)

Power spectral density measurement for large aspheric surfaces

[in Chinese]^1、2, [in Chinese]¹, [in Chinese]¹, [in Chinese]¹, and [in Chinese]¹

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¹[in Chinese]

²[in Chinese]

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DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Power spectral density measurement for large aspheric surfaces[J]. Opto-Electronic Engineering, 2006, 33(3): 20 Copy Citation Text

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References

[3] J M BENNETT.Comparison of techniques for measuring the roughness of optical surface[J].Opt.Eng,1985,24(3):380-387.

[4] E L CHURCH.Fractal surface finish[J].Appl Opt,1988,27(8):1518-1526.

[5] C.R.Wolfe,J.K.Lawson,M.Kellam,et al.Mesurement of wavefront structure from large aperture optical components by phase shifting interferometry[J].SPIE,1995,2536:13-37.

[6] J M ELSON,J M BENNETT.Calculation of the power spectral density from surface profile data[J].Appl Opt,1995,34(1):201-208.

[7] ZHANG Rong-zhu,CAI Bang-wei,YANG Chun-lin,et al.Calculation of the Power Spectral Density of the Wavefront[J].SPIE,2000,4231:295-300.

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Power spectral density measurement for large aspheric surfaces[J]. Opto-Electronic Engineering, 2006, 33(3): 20

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