• Spectroscopy and Spectral Analysis
  • Vol. 45, Issue 3, 616 (2025)
SHEN Guan-ting1, RAO Ke-yi1, FANG Rui-xin1, ZHANG Xue-min1, and WU Zhao-cong1,2,*
Author Affiliations
  • 1School of Remote Sensing Information Engineering,Wuhan University, Wuhan430072, China
  • 2Aerospace Information Research Institute, Henan Academy of Sciences, Zhengzhou450046, China
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    DOI: 10.3964/j.issn.1000-0593(2025)03-0616-07 Cite this Article
    SHEN Guan-ting, RAO Ke-yi, FANG Rui-xin, ZHANG Xue-min, WU Zhao-cong. A Method for Classifying Stains and Defects on Mobile Phone Cover Glass Based on Hyperspectral Line Scan Imaging[J]. Spectroscopy and Spectral Analysis, 2025, 45(3): 616 Copy Citation Text show less
    References

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    [4] Li C, Zhang X, Huang Y, et al. Computers & Industrial Engineering, 2020, 146: 106530.

    [6] Jian C X, Gao J, Ao Y H. Applied Soft Computing, 2017, 52: 348.

    [8] Takhar G, Prakash C, Mittal N, et al. Comparative Analysis of Background Subtraction Techniques and Application, International Conference on Recent Advances & Innovations in Engineering IEEE, 2017.

    [9] Zhang Z, Xu Y, Yang J, et al. IEEE Access, 2015, 3: 490.

    [10] Li D, Liang L Q, Zhang W J, et al. The International Journal of Advanced Manufacturing Technology, 2014, 73(9): 1605.

    [11] Tsai D M, Tseng Y H, Fan S K M. Defect Inspection of Liquid-Crystal-Display (LCD) Panels in Repetilive Pattern Images Using 2D Fourier Image Reconstruction, International Conference on Autonomic and Autonomous Systems, 2018.

    SHEN Guan-ting, RAO Ke-yi, FANG Rui-xin, ZHANG Xue-min, WU Zhao-cong. A Method for Classifying Stains and Defects on Mobile Phone Cover Glass Based on Hyperspectral Line Scan Imaging[J]. Spectroscopy and Spectral Analysis, 2025, 45(3): 616
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