Jiahui Xia, Fang Li, ShuJin Deng, Haibin Wu. Design and Test of High-Resolution Imaging System for Ultracold Atoms[J]. Laser & Optoelectronics Progress, 2022, 59(2): 0222001
- Laser & Optoelectronics Progress
- Vol. 59, Issue 2, 0222001 (2022)
Fig. 1. Lightpath structure of microscopic objective system
Fig. 2. Results of image quality evaluation of microscopic objective system. (a) Spot diagram; (b) ray aberration; (c) MTF curves; (d) wave aberration
Fig. 3. MTF curves of optical system under different thickness of vacuum window
Fig. 4. Photomechanical structure of microscopic objective lens. (a) Design results; (b) physical drawing
Fig. 5. Preliminary test lightpath of resolution board
Fig. 6. High resolution imaging system. (a) Lightpath; (b) ray aberration; (c) spot diagram
Fig. 7. Point spread function test. (a) Pinhole image under electron microscope; (b) pinhole diffraction image on CCD; (c) diffraction pattern of pinhole; (d) Gaussian fitting PSF
|
Table 1. Specific parameters of microscopic objective system
|
Table 2. Parameters of common elements in ultracold atoms
|
Table 3. Tolerance setting of microscopic objective lens
|
Table 4. Analysis results of Monte Carlo
Set citation alerts for the article
Please enter your email address
© Copyright 2018-2021 | Chinese Laser Press. All Rights Reserved 沪ICP备15018463号-20