• Infrared and Laser Engineering
  • Vol. 35, Issue 2, 187 (2006)
[in Chinese]*, [in Chinese], and [in Chinese]
Author Affiliations
  • [in Chinese]
  • show less
    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese]. Laser damage threshold measurement of the optical elements[J]. Infrared and Laser Engineering, 2006, 35(2): 187 Copy Citation Text show less
    References

    [1] HUE J,DIJON J,LYAN P.The CMO YAG laser damage test facility[C]//Proceedings of SPIE,27th Annual Boulder Damage Symposium:Laser-Induced Damage in Optical Materials:1995,1996,2714:102-113.

    [2] HUE J,DIJON J,RAVEL G,et al.Automatic YAG Damage test benches:additional possibilities[C]//Proceedings of SPIE,Laserinduced Damage in Optical Materials:1998,1999,3578:290-301.

    [3] Draft International Standard ISO/DIS 11254,Optics and Optical Instruments-Laser and Laser Related Equipment.Test methods for laser induced damage threshold of optical surface[S].2000.

    [6] KOZLOWSKI M R,THOMAS I M,CAMPBELL J H,et al.Highpower optical coatings for a megajoule-class ICF laser[C]//Proceedings of SPIE,Thin Films for Optical Systems,1993,1782:105-119.

    [7] FOURNET C,PINOT B,GEENEN B,et al.High Damage Threshold Mirrors and Polarizers in the ZrO2/SiO2 and HfO2/SiO2 Dielectrics Systems[C]//Proceedings of SPIE,Laser-Induced Damage in Optical Materials:1991,1992,1624:282-293.

    CLP Journals

    [1] Yinan Zhang, Wen Sun, Defeng Mo, Qinfei Xu, Xue Li. Laser marking process on transparent materials[J]. Infrared and Laser Engineering, 2022, 51(5): 20210416

    [2] Wang Fengrui, Li Qingzhi, Guo Decheng, Huang Jin, Geng Feng. Laser pretreatment parameters optimization of KDP crystal[J]. Infrared and Laser Engineering, 2017, 46(3): 321005

    [3] Xu Junqi, Su Junhong, Ge Jinman, Golosov Dmitriy A. Measurement uncertainty of laser-induced damage threshold of the optical thin films[J]. Infrared and Laser Engineering, 2017, 46(8): 806007

    [in Chinese], [in Chinese], [in Chinese]. Laser damage threshold measurement of the optical elements[J]. Infrared and Laser Engineering, 2006, 35(2): 187
    Download Citation