The Study of Precision Measurement Technology Based on AOTF Imaging Spectrum

XUE Peng; WANG Zhi-bin; ZHANG Rui; XUE Rui; ZHAO Tong-lin

doi:10.3964/j.issn.1000-0593(2016)08-2664-05

Journals >Spectroscopy and Spectral Analysis >Volume 36 >Issue 8 >Page 2664 > Article

Spectroscopy and Spectral Analysis
Vol. 36, Issue 8, 2664 (2016)

The Study of Precision Measurement Technology Based on AOTF Imaging Spectrum

XUE Peng^1、2、3, WANG Zhi-bin^1、2、3, ZHANG Rui^1、3, XUE Rui^2、3, and ZHAO Tong-lin^1、3

Author Affiliations

¹[in Chinese]

²[in Chinese]

³[in Chinese]

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DOI: 10.3964/j.issn.1000-0593(2016)08-2664-05 Cite this Article

XUE Peng, WANG Zhi-bin, ZHANG Rui, XUE Rui, ZHAO Tong-lin. The Study of Precision Measurement Technology Based on AOTF Imaging Spectrum[J]. Spectroscopy and Spectral Analysis, 2016, 36(8): 2664 Copy Citation Text

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References

[1] Gass P A, Sambles J R. Opt. Lett., 1991, 16(6): 429.

[2] Perchik A V. Proc. SPIE, 2013, 8888: 88880P.

[6] Ward Farries M, Pannell C, et al. Proc. SPIE, 2010, 7835: 78350U.

XUE Peng, WANG Zhi-bin, ZHANG Rui, XUE Rui, ZHAO Tong-lin. The Study of Precision Measurement Technology Based on AOTF Imaging Spectrum[J]. Spectroscopy and Spectral Analysis, 2016, 36(8): 2664

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