Influence of Depth of Field on Resolution of a Microscope Polarization Interference Imaging Spectrometer

[in Chinese]; [in Chinese]

[3] Chunmin Zhang, Bin Xiangli, BaoChang Zhao. Static polarization interference imaging spectrometer (SPIIS)[C]. Proc. SPIE, 2000, 4087: 957～961

[4] Chunmin Zhang, Bin Xiangli, Baochang Zhao et al.. A static polarization imaging spectrometer base on Savart polariscope[J]. Opt. Commun., 2002, 203(1～2): 21～26

[5] Chunmin Zhang, Baochang Zhao, Bin Xiangli. Analysis of the modulation depth affected by the polarization orientation in polarization interference imaging spectrometer[J]. Opt. Commun., 2003, 227: 221～225

[7] Chunmin Zhang, Bin Xiangli, Baochang Zhao. Permissible deviations of the polarization orientation in the polarization imaging spectrometer[J]. J. Opt. (A): Pure Appl. Opt., 2004, 6: 815～817

[8] Chunmin Zhang, Baochang Zhao, Bin Xiangli. Wide-field-of-view polarization interference imaging spectrometer[J]. Appl. Opt., 2004, 43(33): 6090～6094

[14] Chunmin Zhang, Baochang Zhao, Bin Xiangli et al.. Birefringent laterally sheared beam splitter-Savart polariscope[C]. Proc. SPIE, 2005, 6148:

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