[1] Spyak P R, Smith D S, Thiry J, et al. Applied Optics, 2000, 39: 31.
[2] Johnson B C, Sakuma F, Butler J J, et al. J. Res. NIST, 1997, 102: 627.
[3] Meister G P, et al. 2002 The First SIMBIOS Radiometric Inter Comparison (SIMRIC-1) NASA Technical Memorandum 210006, NASA Goddard Space Flight Center, Greenbelt, MD 60.
[4] James J Butler, Robert A Barnes. Metrologia, 2003, 40(2003): S70.
[5] Johnson B C, Fowler J B, Cromer C L, 1998: The SeaWiFS Transfer Radiometer(SXR). NASA Tech. Memo. 1998-206892, Vol.1, NASA Goddard Space Flight Center, Greenbelt, Md.
[6] Walker J H, Saunders R D, Hattenburg A T, 1987, Spectral Radiance Calibrations. Special Publication SP 250-1, National Bureau of Standards, Washington, DC, USA.
[7] Larason T C, Bruce S B, Cromer C L. J. Res. Natl. Inst. Stan., 1996 101(02): 133.
[8] Brown S W, Eppeldauer G P, Lykke K R, et al. Applied Optics, 2006, 45(32): .
[9] Thome Kurtis J, Keef James L. Journal of Apllied Remote Sensing, 2009, 3: 1.
[10] Stuart F, Kurtis J Thome, Ronald B Lockwood, et al. 2007, Proc. of SPIE Vol.6677, 66770W, doi: 10.1117/12.740231.
[11] Nik Anderson, Kurt Thome, Stuart Biggar, et al. 2008, Proc. of SPIE Vol.7081, 708104, doi: 10.1117/12.795478.
[12] Keef James L. Dissertation Abstracts International, Supple B, 2008, 69: 3.
[13] Taubert E D, Monte C, Gutschwager B, et al. 2009, Proc. of SPIE, Vol. 7474, 747413, doi:10.1117/12.830082.
[14] Spereld P, Pape S, Nevas S, 2013, AIP Conf. Proce. 1531, 801(2013), doi:10.1063/1.4804891.
[15] Michael Jehle, Andreas Hueni, Karim Lenhard, et al. IEEE Geosci Remote S, 2015, 12: 5.
[16] Michael E Schaepman, Michael Jehle, et al. Remote Sens. Environ., 2015, 158: 207.
[17] Peter Gege, Jochen Fries, Peter Haschberger, et al. ISPRS J. Photogramm, 2009, 64: 387.
[18] Taubert D R, Hollandt J, Sperfeld P, et al. API Conf. Proc., 2013, 1531, 376(2013), doi:10.1063/1.4804785.
[19] Gege P, Fries J, Haschberger P, et al. 2010, Proc. Hyperspectral Workshop, ESRIN, Frascati, Italy.
[20] Schwarzmaier T, Baumgartner A, Gege P, et al. 2013, Proc. of SPIE Vol.8533, 85331U, doi:10.1117/12.974599.
[21] Leibo Ding, Matthew G Kowalewski, et al. Optical Engineering, 2011, 50(11): 113603.
[22] Belyaev Yu V, Rogovets A V, Khomitsevich A D, et al. Journal of Applied Spectroscopy, 2010, 77: 5.
[23] Timothy M Jung, Adriaan C Carter, Solomon I, et al. 2011, Proc. of SPIE, 8015, 80150C-1, doi:10.1117/12.883415.
[24] Liu Enchao, Zheng Xiaobing, Li Xin, et al. Optical and Precision Engineering, 2013, 21(03): 0608.
[25] Cao Haixia, Wu Na, Feng Shulong, et al. Optical and Precision Engineering, 2014, 22(10): 2585.