Applications of thickness measurement method based on terahertz time-of-flight in atmospheric environment

Wulin GONG; Zhanfeng LI; Quancheng LIU; Hu DENG; Zhixiang WU

doi:10.5768/JAO202344.0403001

Journals >Journal of Applied Optics >Volume 44 >Issue 4 >Page 809 > Article

Journal of Applied Optics
Vol. 44, Issue 4, 809 (2023)

Applications of thickness measurement method based on terahertz time-of-flight in atmospheric environment

Wulin GONG^1,3, Zhanfeng LI^1,3, Quancheng LIU^2,3,*, Hu DENG^2,3, and Zhixiang WU^2,3

Author Affiliations

¹School of Manufacturing Science and Engineering, Southwest University of Science and Technology, Mianyang 621010, China

²School of Information Engineering, Southwest University of Science and Technology, Mianyang 621010, China

³Tianfu Institute of Research and Innovation, Southwest University of Science and Technology, Chengdu 610299, China

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DOI: 10.5768/JAO202344.0403001 Cite this Article

Wulin GONG, Zhanfeng LI, Quancheng LIU, Hu DENG, Zhixiang WU. Applications of thickness measurement method based on terahertz time-of-flight in atmospheric environment[J]. Journal of Applied Optics, 2023, 44(4): 809 Copy Citation Text

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