• Journal of Applied Optics
  • Vol. 44, Issue 4, 809 (2023)
Wulin GONG1,3, Zhanfeng LI1,3, Quancheng LIU2,3,*, Hu DENG2,3, and Zhixiang WU2,3
Author Affiliations
  • 1School of Manufacturing Science and Engineering, Southwest University of Science and Technology, Mianyang 621010, China
  • 2School of Information Engineering, Southwest University of Science and Technology, Mianyang 621010, China
  • 3Tianfu Institute of Research and Innovation, Southwest University of Science and Technology, Chengdu 610299, China
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    DOI: 10.5768/JAO202344.0403001 Cite this Article
    Wulin GONG, Zhanfeng LI, Quancheng LIU, Hu DENG, Zhixiang WU. Applications of thickness measurement method based on terahertz time-of-flight in atmospheric environment[J]. Journal of Applied Optics, 2023, 44(4): 809 Copy Citation Text show less

    Abstract

    Terahertz time-of-flight (THz-TOF) method is a new development direction in the field of thickness measurement, which has the advantages of fast, non-destructive and high precision. However, the water vapor in atmospheric environment has strong absorption of terahertz wave, which limits the application of THz-TOF method in atmospheric environment. The propagation mechanism of terahertz wave in atmospheric environment in THz-TOF method was firstly analyzed, and then a method of water vapor elimination based on absorption model was proposed. Finally, two kinds of plastic plate samples were used as the object of application research. By comparing with the measurement results in dry environment, the results show that the method can effectively eliminate the interference of water vapor and realize the accurate measurement of material thickness and refractive index in atmospheric environment.
    Wulin GONG, Zhanfeng LI, Quancheng LIU, Hu DENG, Zhixiang WU. Applications of thickness measurement method based on terahertz time-of-flight in atmospheric environment[J]. Journal of Applied Optics, 2023, 44(4): 809
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