• Opto-Electronic Engineering
  • Vol. 34, Issue 7, 30 (2007)
[in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese]. Signal process in a novel system for nano-displacement measurement based on optical lever[J]. Opto-Electronic Engineering, 2007, 34(7): 30 Copy Citation Text show less

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    [in Chinese], [in Chinese], [in Chinese]. Signal process in a novel system for nano-displacement measurement based on optical lever[J]. Opto-Electronic Engineering, 2007, 34(7): 30
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