[1] Hutchins M G, Topping A J, Anderson C, et al. Measurement and prediction of angle-dependent optical properties of coated glass products: results of an inter-laboratory comparison of spectral transmittance and reflectance [ J ]. Thin solid Films, 2001,392: 269-275.
[2] Shen Y J, Zhang Z M, Tsai B K, et al. Bidirectional reflectance distribution function of rough silicon wafers [ J ]. International Journal of Thermophysics , 2001, 22: 1311-1326.
[3] Geotti-Bianchini F, Preo M, Guglielmi M, et al. Infrared reflectance spectra of semi-transparent SiO2 rich films on silicate glasses: influence of the substrate and film thickness[J]. Journal of Non-Crystalline Solids, 2003, 321: 110-119.
[4] Makino T, Nakamura A, Wakabayashi H. Directional characteristics of radiation reflection on rough metal surfaces with description of heat transfer parameters [ J ]. JSME International Journal, Series B, 1999, 42(4) : 745-751.
[5] Rodriguez J, Gomez M, Ederth J, et al. Thickness dependence of the optical properties of sputter deposited Ti oxides films [J]. Thin Solid Films, 2000, 365: 119-125.
[6] Nijnatten P A. A pseudo-Fresnel approach for predicting directional optical properties of coated glazing [ J]. Thin Solid Films, 2001,392: 282-288.