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    Journals >Acta Optica Sinica >Volume 43 >Issue 21 >Page 2114001 > Article
    • Acta Optica Sinica
    • Vol. 43, Issue 21, 2114001 (2023)
    Critical Thickness of Indium Atom Self-Fitting Migration in InGaAs Well-Cluster Composite Structure
    Qingnan Yu1,*, Zijian Liu1, Xinyu Wang1, Ke Li1..., Ru Wang1, Xinyu Liu1, Yu Pan1, Hui Li1 and Jianwei Zhang2|Show fewer author(s)
    Author Affiliations
  • 1Jiangsu Province Engineering Research Center of Integrated Circuit Reliability Technology and Testing System, Wuxi University, Wuxi 214105, Jiangsu , China
  • 2Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, Jilin , China
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    DOI: 10.3788/AOS230909 Cite this Article Set citation alerts
    Qingnan Yu, Zijian Liu, Xinyu Wang, Ke Li, Ru Wang, Xinyu Liu, Yu Pan, Hui Li, Jianwei Zhang. Critical Thickness of Indium Atom Self-Fitting Migration in InGaAs Well-Cluster Composite Structure[J]. Acta Optica Sinica, 2023, 43(21): 2114001 Copy Citation Text show less
    InGaAs/GaAs asymmetric WCC quantum-confined structure and appearance characteristics of IRC
    Fig. 1. InGaAs/GaAs asymmetric WCC quantum-confined structure and appearance characteristics of IRC
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    SE spectra with dual peaks emitted from WCC structure and experimental measurement system
    Fig. 2. SE spectra with dual peaks emitted from WCC structure and experimental measurement system
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    Material thickness distribution. (a) Ratio of spontaneous emission intensity of In0.17Ga0.83As and In0.12Ga0.88As; (b) contour of In0.17Ga0.83As layer thickness
    Fig. 3. Material thickness distribution. (a) Ratio of spontaneous emission intensity of In0.17Ga0.83As and In0.12Ga0.88As; (b) contour of In0.17Ga0.83As layer thickness
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    SE spectra of WCC sample and 4 nm thick In0.17Ga0.83As quantum well
    Fig. 4. SE spectra of WCC sample and 4 nm thick In0.17Ga0.83As quantum well
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    Qingnan Yu, Zijian Liu, Xinyu Wang, Ke Li, Ru Wang, Xinyu Liu, Yu Pan, Hui Li, Jianwei Zhang. Critical Thickness of Indium Atom Self-Fitting Migration in InGaAs Well-Cluster Composite Structure[J]. Acta Optica Sinica, 2023, 43(21): 2114001
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    Paper Information
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