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    Journals >Infrared and Laser Engineering >Volume 46 >Issue 3 >Page 302001 > Article
    • Infrared and Laser Engineering
    • Vol. 46, Issue 3, 302001 (2017)
    3D measurement decoupling criterion in optical microscopy
    Liu Jian, Gu Kang, Li Mengzhou, and Tan Jiubin
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  • [in Chinese]
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    DOI: 10.3788/irla201746.0302001 Cite this Article
    Liu Jian, Gu Kang, Li Mengzhou, Tan Jiubin. 3D measurement decoupling criterion in optical microscopy[J]. Infrared and Laser Engineering, 2017, 46(3): 302001 Copy Citation Text show less
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    Liu Jian, Gu Kang, Li Mengzhou, Tan Jiubin. 3D measurement decoupling criterion in optical microscopy[J]. Infrared and Laser Engineering, 2017, 46(3): 302001
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