Preliminary Study on Storage Life Distribution of Semiconductor Device Based on Weibull Distribution

Qiaofang WANG; Wanxiang ZHENG; Chongwen WANG; Jian LIU; Rui LUO; Yuanrong ZHAO

Journals >Infrared Technology >Volume 42 >Issue 11 >Page 1077 > Article

Infrared Technology
Vol. 42, Issue 11, 1077 (2020)

Preliminary Study on Storage Life Distribution of Semiconductor Device Based on Weibull Distribution

Qiaofang WANG^1、2、*, Wanxiang ZHENG¹, Chongwen WANG², Jian LIU², Rui LUO^1、2, and Yuanrong ZHAO²

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¹[in Chinese]

²[in Chinese]

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DOI: Cite this Article

WANG Qiaofang, ZHENG Wanxiang, WANG Chongwen, LIU Jian, LUO Rui, ZHAO Yuanrong. Preliminary Study on Storage Life Distribution of Semiconductor Device Based on Weibull Distribution[J]. Infrared Technology, 2020, 42(11): 1077 Copy Citation Text

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References

[3] Eisenbrand F, Karrenbauer A, XU C. Algorithms for longer OLED lifetime[J]. Lecture Notes in Computer. Science, 2007, 4525: 338-351.

[4] HAN C W, KIM H K, PANG H S, et al. Dual plate OLED display(DOD) embedded with white OLED[J]. J. Display Technol., 2009, 5(12):541-545

[5] NElSON W B. Accelerated Life Testing-step-stress Model Sand Data Analysis[J]. IEEE Transactions on Reliability, 1980, 29(2): 103-108.

[7] ELSAYED A. Reliability Engineering[M]. 2nd (SECOND EDITION) , 1984.

[9] ROLINK. Infrared Focal Plane Array Storage Life Assessment By Accelerated Aging[J]. Quality and Reliability Engineering International, 1998, 14(6): 425-432.

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