• Infrared and Laser Engineering
  • Vol. 45, Issue 4, 404003 (2016)
Shi Haoran1,*, Li Zhaolong1, Shen Tongsheng2, and Lou Shuli3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • show less
    DOI: 10.3788/irla201645.0404003 Cite this Article
    Shi Haoran, Li Zhaolong, Shen Tongsheng, Lou Shuli. Aliasing effect of sampled infrared imaging system[J]. Infrared and Laser Engineering, 2016, 45(4): 404003 Copy Citation Text show less
    References

    [1] Nao Sheng Qiao, Chun Mei Yao. Study of sampling in CCD photoelectric imaging system[J]. Applied Mechanics and Materials, 2012, 220-223: 2087-2090.

    [2] Grundland M, Patera J, Zuzana MAS'AK-OV'A. Image sampling with quasicrystals[J]. SIGMA, 2009, 75(5): 1-23.

    [3] Zhang Haitao, Zhao Dazun. Quantitative analysis of aliasing effects in opto-electric imaging systems[J]. Acta Optica Sinica, 1999, 19(12): 1649-1654. (in Chinese)

    [4] Wang Xiaorui, Zhang Jianqi, Feng Zhuoxiang, et al. Sampled IR imaging system simulation and MRTD prediction[J].Journal Infrared Millimeter and Waves, 2004, 23(6): 436-440. (in Chinese)

    [5] Wang Changwei, Jiang Yuesong, Liu Li, et al. Research on detector sampling of optical synthetic aperture imaging system[J]. Journal of Optoelectronics·Laser, 2010, 21(3): 424-429. (in Chinese)

    [6] William K Pratt. Digital Image Processing[M]. 4th ed. Beijing: China Machine Press, 2009: 75-85. (in Chinese)

    [7] Luke Scott, John D′Agostino. NVEOD FLIR92 thermal imaging systems performance model[C]//SPIE Aerospace Sensing Symposium, 1992, 1689(13): 194-203.

    [8] Zhang Jianqi, Wang Xiaorui. Modeling of Optical Imaging System and Performance Evaluation Theory[M]. Xi′an: Xidian University Press, 2010. (in Chinese)

    Shi Haoran, Li Zhaolong, Shen Tongsheng, Lou Shuli. Aliasing effect of sampled infrared imaging system[J]. Infrared and Laser Engineering, 2016, 45(4): 404003
    Download Citation