• Opto-Electronic Engineering
  • Vol. 36, Issue 3, 135 (2009)
YAN Feng1、*, FAN Di2, ZHANG Bin-zhi1, YIN Long-hai1, LI Rui-gang2, and ZHANG Xue-jun2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    YAN Feng, FAN Di, ZHANG Bin-zhi, YIN Long-hai, LI Rui-gang, ZHANG Xue-jun. Manufacturing and Testing of a SiC Unrotational-symmetric Aspherical Optics[J]. Opto-Electronic Engineering, 2009, 36(3): 135 Copy Citation Text show less
    References

    [1] Dowski Edward R,Johnson Gregory E. Johnson. Wavefront Coding:A modern method of achieving high performance and/or low cost imaging systems [J]. Proc. of SPIE(S0277-786X),1999,3779:137-145.

    [2] FAN Di,ZHANG Zhong-yu.Optical surfacing of spherical reaction-burned silicon carbide(RB-SIC)mirror [J]. Journal of the Chinese Ceramic Society,2003,31(11):1096-1100.

    [3] LI Quan-sheng,CHENG Ye.NC fabrication method of optical free—form surface [J]. Optical Technique,1998,11(6):77-8l.

    [4] WANG Gui-lin,DAI Yi-fan.Research on the determination for the abrasive disk’s dimension in aspheric optics machine [J]. Chinese Journal Mechanical Engineering,2004,40(1):147-150.

    [5] Gappinger Robert O,Greivenkamp John E. Non-null interferometer for measurement of aspheric transmitted wavefronts [J]. Proc. of SPIE(S0277-786X),2003,5180:301-312.

    [6] Murphy Oaue E,Brown Thomas G,Moore Duncan T. Interference imaging for aspheric surface testing [J]. Applied Optics (S0003-6935),2000,39(13):2122-2129.

    [7] Greivenkamp John E,Gappinger Robert O. Design of a nonnull interferometer for aspheric wave fronts [J]. Applied Optics (S0003-6935),2004,43(27):5143-5151

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    YAN Feng, FAN Di, ZHANG Bin-zhi, YIN Long-hai, LI Rui-gang, ZHANG Xue-jun. Manufacturing and Testing of a SiC Unrotational-symmetric Aspherical Optics[J]. Opto-Electronic Engineering, 2009, 36(3): 135
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