• Opto-Electronic Engineering
  • Vol. 41, Issue 6, 32 (2014)
ZHANG Zengfu*, ZOU Debao, CHEN Wenliang, ZHAO Huijuan, and XU Kexin
Author Affiliations
  • [in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2014.06.006 Cite this Article
    ZHANG Zengfu, ZOU Debao, CHEN Wenliang, ZHAO Huijuan, XU Kexin. Temperature Influence in the TDLAS Detection of Escaping Ammonia[J]. Opto-Electronic Engineering, 2014, 41(6): 32 Copy Citation Text show less
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    CLP Journals

    [1] LI Long, YANG Yan’gang, CHEN Wenliang, DU Zhenhui, XU Kexin. Correction of Influence Conditions in TDLAS Ammonia Measuring Based on Hollow Waveguide Cell[J]. Opto-Electronic Engineering, 2015, 42(12): 35

    ZHANG Zengfu, ZOU Debao, CHEN Wenliang, ZHAO Huijuan, XU Kexin. Temperature Influence in the TDLAS Detection of Escaping Ammonia[J]. Opto-Electronic Engineering, 2014, 41(6): 32
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