Author Affiliations
School of Optoelectronic Engineering and Instrumentation Science, Dalian University of Technology, Dalian 116024, Liaoning, Chinashow less
Fig. 1. Working principle of AO on basis of direct wavefront sensing. (a) Schematic of the AO system; (b) working principle of Shack-Hartmann wavefront sensor; (c) working principle of pyramid wavefront sensor (top) and partitioned aperture wavefront sensor (bottom); (d) working principle of shearing interferometer
Fig. 2. Application of AO in STED microscopy. (a) Schematic of STED microscopy; (b) using two SLMs to correct aberrations in both excitation and STED paths
[44]; (c) using AO to align the excitation and STED paths
[45]; (d) using the SLM in an off-axis holography configuration
[46]; (e) using DM and SLM to correct aberrations in all the three paths
[47] (S, specimen; Di, dichroic mirror; APD, avalanche photodiode; Exc., excitation beam; Emi., emission beam; QWP, quarter wave plate; PMT, photomultiplier)
Fig. 3. Comparison of STED images with and without AO. (a) Imaging of axon structures of hiPSCs in dopamine neurons at a depth of 80 μm
[50]; (b) imaging of astrocytes in fixed mouse brain tissues at a depth of 164 μm
[55] Fig. 4. Application of AO in 4Pi-STED microscopy
[53]. S, specimen; Di, dichroic mirror; APD, avalanche photodiode; Exc., excitation beam; Emi., emission beam; RM, resonant mirror; GM, galvo mirror
Fig. 5. Comparison of SIM images with and without AO. (a) Imaging of neurites in a larval zebrafish brain at a depth of 100 μm
[62]; (b)
in vivo structural imaging of the mouse brain at a depth of 21‒29 μm
[63] Fig. 6. Application of AO in SIM. (a) Schematic of SIM; (b) application of AO in an OS-SIM
[63]; (c) combining SIM with direct wavefront sensing
[64]. S, specimen; Di, dichroic mirror; PH, pinhole; PBS, polarizing beam splitter; RM, rotatable mirror
Fig. 7. Application of AO in SMLM. (a) Schematic of SMLM imaging; (b) schematic of instrumentation-induced aberration correction with AO
[67]; (c) aberration correction with the modal sensing technique
[68]; (d) aberration correction with genetic algorithm
[69]; (e) aberration correction with PSO
[70]; (f) working principle of REALM
[72]; (g) working principle of DL-AO
[73]; (h) schematic of CLASS
[74]. S, specimen; Di, dichroic mirror; FM, flip mirror; GM, galvo mirror; BS, beam splitter; DG, diffraction grating; PBS, polarizing beam splitter; Exc., excitation beam; Act., activation beam; Emi.,emission beam
Fig. 8. Comparison of SMLM images with and without AO. (a) Microtubules at a depth of 50 μm
[72]; (b) mitochondria at a depth of 133 μm
[73]