• Opto-Electronic Advances
  • Vol. 6, Issue 12, 230017 (2023)
Chunyan Chu1,2, Zhentao Liu3,4,*, Mingliang Chen3,4,**, Xuehui Shao5..., Guohai Situ3,4, Yuejin Zhao1,2 and Shensheng Han3,6|Show fewer author(s)
Author Affiliations
  • 1Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, Beijing 100081, China
  • 2School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China
  • 3Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 4University of Chinese Academy of Sciences, Beijing 100049, China
  • 5National Laboratory of Aerospace Intelligent Control Technology, Beijing 100089, China
  • 6Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences, Hangzhou 310024, China
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    DOI: 10.29026/oea.2023.230017 Cite this Article
    Chunyan Chu, Zhentao Liu, Mingliang Chen, Xuehui Shao, Guohai Situ, Yuejin Zhao, Shensheng Han. Wide-spectrum optical synthetic aperture imaging via spatial intensity interferometry[J]. Opto-Electronic Advances, 2023, 6(12): 230017 Copy Citation Text show less
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    Chunyan Chu, Zhentao Liu, Mingliang Chen, Xuehui Shao, Guohai Situ, Yuejin Zhao, Shensheng Han. Wide-spectrum optical synthetic aperture imaging via spatial intensity interferometry[J]. Opto-Electronic Advances, 2023, 6(12): 230017
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