Changshuai FANG, Zhaoyang LIU, Qianwen WANG, Xiaodong ZHANG. Low-cost incremental registration method for measuring the surface topography of weak features[J]. Infrared and Laser Engineering, 2024, 53(7): 20240082

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- Infrared and Laser Engineering
- Vol. 53, Issue 7, 20240082 (2024)

Fig. 1. Schematic diagram for calculating intersection points and intersection distances

Fig. 2. (a) The top view and (b) the side view of the spatial pose of the measured data after registration to the RPS point and the spatial pose of the model; (c) The top view and (d) the side view of the spatial pose of the measured data after registration to the model point and the spatial pose of the model

Fig. 3. Progressive matching algorithm flowchart

Fig. 4. Simulation process

Fig. 5. (a) Spatial attitude of the model and the measured data before coarse matching; (b) The difference between the measured data and the model after matching and the difference between the three coordinates and the model

Fig. 6. (a) Two deviations after rough matching during simulation; (b) Two deviations after the first fine-tuning during simulation; (c) Two deviations after the second fine-tuning during simulation; (d) The deviation result between the measured data and the three coordinates after the second fine-tuning during simulation

Fig. 7. The deviation between the measured data after registration and the CMM (a) without coarse registration steps and (b) without the first step of fine-tuning

Fig. 8. Data acquisition system

Fig. 9. (a) Standard steps; (b) Dynamic testing experiment on measurement accuracy of steps at different heights

Fig. 10. (a) Three-dimensional data for measuring automotive glass; (b) Part CMM points and RPS points

Fig. 11. (a) The two deviations after rough matching during actual measurement; (b) The two deviations after the first fine-tuning during actual measurement; (c) The two deviations after the second fine-tuning during actual measurement; (d) The deviation result between the measured data and the three coordinates after the second fine-tuning during actual measurement

Fig. 12. (a) The deviation between the measurement data directly matched to the coordinate system of the RPS point and the model, as well as the deviation between the three coordinates and the model; The deviation between the measured data after registration and the CMM (b) without coarse registration steps and (c) without the first step of fine-tuning
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Table 1. System parameter

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